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| author | YurenHao0426 <Blackhao0426@gmail.com> | 2026-08-29 18:34:49 -0500 |
|---|---|---|
| committer | YurenHao0426 <Blackhao0426@gmail.com> | 2026-08-29 18:34:49 -0500 |
| commit | 3562fd83ef8fc7f1ebede7571301224f2b5368c7 (patch) | |
| tree | 7a9613117068ba2e9da6ae85c4eaf98376a12955 /visual-composer/physical-hardware-evidence.md | |
| parent | 2509cbf0eed13ab1ab0eaf83a65b920384988d80 (diff) | |
figure: consolidate hardware-realistic CLLN evidence
Diffstat (limited to 'visual-composer/physical-hardware-evidence.md')
| -rw-r--r-- | visual-composer/physical-hardware-evidence.md | 40 |
1 files changed, 40 insertions, 0 deletions
diff --git a/visual-composer/physical-hardware-evidence.md b/visual-composer/physical-hardware-evidence.md new file mode 100644 index 0000000..b271127 --- /dev/null +++ b/visual-composer/physical-hardware-evidence.md @@ -0,0 +1,40 @@ +# Visual contract: hardware-realistic CLLN evidence + +- **Artifact:** three-panel quantitative result figure. +- **Target venue / format:** ICLR two-column paper, full-width figure. +- **Core claim:** local innovation subtraction restores nonlinear CLLN + learning under published component imperfections and remains effective with + nonideal local sampling. +- **Reviewer question:** does the method survive component mismatch, sampler + mismatch, noise, stale refresh, and their combination at the task endpoint? +- **Evidence layer:** hardware-realistic simulation; no fabricated-chip claim. +- **Source data:** + `results/physical_bias/p5_full_grid_bias_crossover.json`, + `results/physical_bias/p9_grid_correlated_autozero.json`, and + `results/physical_bias/p8_spice_autozero_primitive.json`. +- **Statistics / uncertainty:** four device draws are averaged within each of + 40 tasks; tasks are resampled for percentile 95% bootstrap intervals. +- **Figure prototype:** horizontal method comparison, mismatch response curves, + and horizontal nonideality comparison. +- **Panel map:** + - (a) nonlinear CLLN final error across clean, raw, calibration, + overclamping, SDIL, and their combination; + - (b) final error against measured local sampling-error RMSE for pedestal + and gain mismatch sweeps; + - (c) final error under common pedestal, sampling noise, stale neutral + refresh, and combined nonidealities. +- **Exact label inventory:** nonlinear CLLN, component errors, sample-path + mismatch, residual sampling error, nonideal local sampling, final + classification error. +- **Caption role:** identify the published component-error scale, the local + correlated-double-sampling operation, task/device counts, and the boundary + between simulation and fabricated hardware. +- **Manuscript placement:** Part 3, after the digital scaling result. +- **Output formats:** editable SVG, vector PDF, PNG preview, analysis JSON, and + source CSV. +- **Traceability:** every plotted aggregate is regenerated by + `experiments/plot_physical_hardware_evidence.py`; the SPICE primitive is + carried in the analysis manifest and reserved for supplementary evidence. +- **Constraint:** circuit-solver failures remain classification failures. + Sampler RMSE excludes the missing diagnostic value on failed solves, while + the task endpoint includes every trial. |
