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| author | Yuren Hao <yurenh2@illinois.edu> | 2026-08-05 04:24:55 -0500 |
|---|---|---|
| committer | Yuren Hao <yurenh2@illinois.edu> | 2026-08-05 04:24:55 -0500 |
| commit | 61d55ff1fdf53fd58d8939087ce81f92c7197b7f (patch) | |
| tree | cbb88422fa64bd52cba168547406c6c2b9c524ba /ep_run/holo_fast_gate.py | |
| parent | 2bb35988232d5d2e84a9b6afa617c4dc3de776ec (diff) | |
表征方案修订(用户纠正): 优化器建模义务不因不造板而消失
撤回"Muon问题消解"的说法: 消失的只是台架工程风险, 被模拟的系统必须带基底做得出的优化器。
新增: 测量项#6写入路径(单步增量/上下不对称/电荷注入/最小可写增量=硬件版舍入地板, 与fp32
读出地板同构=预注册预测点); 优化器行为级设计节(SGDM/Lion/factored-Adam三候选全部从元件表
取参数, 旧"Lion发散"判决系修复前旧架构须复测); 优化器价目表实验从可选升级为必做(理想数学
版与叠加实测缺陷版两级分开报); 增设混合信号对照臂使全模拟vs混合信号成为可测轴。
Co-Authored-By: Claude Fable 5 <noreply@anthropic.com>
Claude-Session: https://claude.ai/code/session_014FAPDWQ49M5Ye3NpTndTpn
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